Application of relative configurational entropy as a measure of spatial inhomogeneity to Co/C film evolving along the temperature

A physical measure based on configurational entropy was proposed to analyze an inhomogeneity degree of transmission electron microscopy of thin gold films. This method was treated as one possible approach to find a supposed connection between the changes in the structure of a thin film subject to he...

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Bibliographic Details
Published inJournal of materials science letters Vol. 19; no. 15; pp. 1369 - 1371
Main Authors Garncarek, Z., Majcherczyk, T., Potoczna-Petru, D., Piasecki, R.
Format Journal Article
LanguageEnglish
Published Dordrecht Kluwer Academic Publishers 01.08.2000
Subjects
Applied sciences
Composition and phase identification
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Metals. Metallurgy
Physics
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Temperature dependence
Configuration
Measuring methods
Entropy
Experimental study
Carbon
Cobalt
Heat treatments
Substrates
Metallic thin films
Spatial distribution
Transition elements
Nonmetals
Inhomogeneity
TEM
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Summary:A physical measure based on configurational entropy was proposed to analyze an inhomogeneity degree of transmission electron microscopy of thin gold films. This method was treated as one possible approach to find a supposed connection between the changes in the structure of a thin film subject to heating conditions.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0261-8028
1573-4811
DOI:10.1023/A:1006709417525