Development of high-resolution time pick-off detector based on Micro-Channel Plate

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 1055; p. 168485
• Main Authors: XiangLei, Wang, ZhiSheng, Huang, DongWei, Hei, QuanLin, Shi, WenGang, Jiang
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.10.2023
• Subjects: Digital timing method; E-v method; Electron optical simulation; SED-MCP; Time resolution; Electron optical simulation; SED-MCP; Time resolution; E-v method; Digital timing method
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2023.168485

As the Energy-velocity (E-(v) mass spectrometer garners increasing attention, researchers have observed that the temporal resolution of time-of-flight detectors has become a limiting factor in enhancing the detection efficiency of E-v devices. Consequently, this necessitating higher time-resolution requirements for these detectors. SED-MCP, or Secondary Electron Time Detector based on Micro-Channel Plate, is a type of detector capable of accurately measuring the flight time of particles without significantly interfering with their motion. In this study, we optimized the design parameters of SED-MCP through electron optical simulation and achieved a secondary electron flight time spread of less than 20 ps. Furthermore, we established a digital electronic system and a scaling-free digital timing method to minimize timing uncertainties and improve detection efficiency. As a result of these efforts, a SED-MCP with an intrinsic time resolution of 57 ± 5 ps was developed. This resolution surpasses those of similar detectors used in E-v mass spectrometers and holds substantial significance for improving the mass resolution and detection efficiency of the E-v mass spectrometer.