Ion-beam induced defect formation in α-alumina with applied electric field

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 206; pp. 103 - 108
Main Authors Higuchi, T., Yasuda, K., Tanaka, K., Shiiyama, K., Kinoshita, C.
Format Journal Article
LanguageEnglish
Published 01.05.2003
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ISSN:0168-583X
DOI:10.1016/S0168-583X(03)00693-1