Improved method for determining inversion layer mobility of electrons in trench MOSFETs
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Published in | IEE proceedings. Circuits, devices and systems Vol. 151; no. 3; pp. 225 - 230 |
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Main Authors | , , , |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
Stevenage
Institution of Electrical Engineers
2004
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Subjects | |
Online Access | Get full text |
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ISSN: | 1350-2409 |
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DOI: | 10.1049/ip-cds:20040454 |