Characteristics and radiation effects of MOS capacitors with Al2O3 layers in p-type silicon

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Bibliographic Details
Published inApplied radiation and isotopes Vol. 46; no. 5; pp. 355 - 361
Main Authors Soliman, F.A.S., Al-Kabbani, A.S.S., Sharshar, K.A.A., Rageh, M.S.I.
Format Journal Article
LanguageEnglish
Published 01.05.1995
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ISSN:0969-8043
DOI:10.1016/0969-8043(94)00141-L