Absorption spectra, energy dispersive analysis of X-rays and transmission electron microscopy of silver particles in sol-gel glass films

Silver particles in sol-gel films were obtained by chemical reduction using stannous ions. Their absorption spectra and transmission electron microscopy (TEM) photographs were compared with those of silver particles obtained by a sputtering technique. Electron dispersive analysis of X-rays (EDAX) al...

Full description

Saved in:
Bibliographic Details
Published inChemical physics letters Vol. 153; no. 2; pp. 203 - 209
Main Authors Brusilovsky, D., Eyal, M., Reisfeld, R.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 09.12.1988
Elsevier Science
Subjects
Analysing. Testing. Standards
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Measurement of properties and materials state
Metals, semimetals and alloys
Metals. Metallurgy
Nondestructive testing
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
Specific materials
Transmission electron microscopy
Energy dispersion
Sol gel process
Transition metal
X ray
Experimental study
Microstructure
Metal particle
Optical absorption
Thin film
Online AccessGet full text

Cover

More Information
Summary:Silver particles in sol-gel films were obtained by chemical reduction using stannous ions. Their absorption spectra and transmission electron microscopy (TEM) photographs were compared with those of silver particles obtained by a sputtering technique. Electron dispersive analysis of X-rays (EDAX) allows mapping of silver particles in the films.
ISSN:0009-2614
1873-4448
DOI:10.1016/0009-2614(88)85213-8