Assessment of photooxidation in multi-layer coating systems by time-of-flight secondary ion mass spectrometry
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to assess the formation of 18O-labeled photooxidation products in two multi-layer coating systems held in 20% 18O 2/80% nitrogen atmosphere during brief Xenon arc weatherometer exposure. A four-layer model coating system without...
Saved in:
Published in | Polymer degradation and stability Vol. 47; no. 3; pp. 405 - 411 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier Ltd
1995
Elsevier Science |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to assess the formation of
18O-labeled photooxidation products in two multi-layer coating systems held in 20%
18O
2/80% nitrogen atmosphere during brief Xenon arc weatherometer exposure. A four-layer model coating system without hindered amine light stabilizer or ultraviolet light absorber additives was examined first. The model was exposed for 8 days in the weatherometer, and then its TOF-SIMS-
18O
− response was recorded. This response tracks the known photooxidation resistance of the coating layers used to prepare the model system. Next, the technique was extended to a fully formulated six-layer ‘repair’ paint panel that had been weathered for 4 years in Florida prior to 10 additional days of weatherometer exposure in 20%
18O
2/80% nitrogen atmosphere. The TOF-SIMS-
18O
− response observed clearly suggests that the TOF-SIMS-
18O
− technique can be used to assess the relative photooxidation rates of individual coating layers in fully formulated, multi-layer coating systems. |
---|---|
ISSN: | 0141-3910 1873-2321 |
DOI: | 10.1016/0141-3910(95)00007-0 |