Optical and electron microscopy of sapphire irradiated with an applied electric field at 450°C

Single crystal α-alumina (sapphire) has been irradiated with 1.8 MeV electrons at a temperature of 450°C while subject to an electric field of 130 kV/m. At intervals during the course of the irradiation the electron beam was switched off and the electrical conductivity of the sapphire was measured a...

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Bibliographic Details
Published inJournal of nuclear materials Vol. 226; no. 3; pp. 286 - 292
Main Authors Pells, G.P., Hodgson, E.R.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.11.1995
Elsevier
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ISSN0022-3115
1873-4820
DOI10.1016/0022-3115(96)80001-8

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Summary:Single crystal α-alumina (sapphire) has been irradiated with 1.8 MeV electrons at a temperature of 450°C while subject to an electric field of 130 kV/m. At intervals during the course of the irradiation the electron beam was switched off and the electrical conductivity of the sapphire was measured at 450°C. After a damage dose of ≈ 10−7 dpa the intrinsic electrical conductivity began to rise, increasing by four orders of magnitude after only 8 × 10−6 dpa. The combination of displacement damage, electric field and temperature leading to increased electrical conductivity is known as the RIED effect (Radiation-Induced Electrical Degradation). Optical microscopy of the irradiated sapphire revealed thin disc shaped precipitates but only in the irradiated area of the sample subject to an electric field. TEM of the irradiated area showed that the precipitates consisted of an intimate mixture of α- and γ-alumina with (0006¯) sapphire //(1¯11¯) γ-)alumina and (011¯2) sapphire //(311) γ-alumina. The relative orientations of α- and γ-alumina show that a phase change is involved which has not been previously observed in bulk irradiated alumina.
ISSN:0022-3115
1873-4820
DOI:10.1016/0022-3115(96)80001-8