Annealing effect on the characteristics of La0.67Sr0.33MnO3 polycrystalline thin films produced by the sol–gel dip-coating process

• Published in: Journal of materials science. Materials in electronics Vol. 23; no. 2; pp. 605 - 611
• Main Authors: Goktas, Abdullah, Aslan, Ferhat, Mutlu, İbrahim Halil
• Format: Journal Article
• Language: English
• Published: Boston Springer US 01.02.2012; Springer
• Subjects: Annealing; Applied sciences; Characterization and Evaluation of Materials; Chemistry and Materials Science; Cold working, work hardening; annealing, quenching, tempering, recovery, and recrystallization; textures; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Heat treatment; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials Science; Materials synthesis; materials processing; Metals. Metallurgy; Methods of deposition of films and coatings; film growth and epitaxy; Optical and Electronic Materials; Physics; Production techniques; Treatment of materials and its effects on microstructure and properties; Full Width Half Maximum; Manganite; Magnetic Domain Wall; Colossal Magneto Resistance; Film Sample; Coating process; Grain size analysis; Perovskite type compound; Polycrystal; Temperature effect; Ferromagnetic materials; Annealing temperature; Phase transitions; Powder; Thin film; Magnetic field effect; Paramagnetic materials; Dip coating; Magnetic field; Thermal characteristic; Grain size; Temperature dependence; Scanning electron microscopy; Annealing; Dielectric materials; Colossal magnetoresistance; Lattice parameters; X ray diffraction; Thickness; Silicon oxides; Manufacturing process; Sol gel process

The effect of annealing temperature on selected characteristics of polycrystalline La 0.67 Sr 0.33 MnO 3 films, which have been produced on quartz substrates, was investigated. X-Ray powder diffraction patterns showed that the phase formation started at 873 K and all the films had perovskite structu...