Constant-step stress accelerated life test of VFD under Weibull distribution case

• Published in: Journal of Zhejiang University. A. Science Vol. 6; no. 7; pp. 722 - 727
• Main Author: 张建平 耿新民
• Format: Journal Article
• Language: English
• Published: Department of Information & Electronic Engineering, Zhejiang University, Hangzhou 310027, China%Faculty of Computer and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China 01.07.2005
• Subjects: Arrhenius方程; VFD; Weibull分布; 寿命测试; 真空荧光显示器; Accelerated life test; Vacuum Fluorescent Display; Weibull; Average life; Constant-step
• ISSN: 1673-565X; 1862-1775
• DOI: 10.1631/jzus.2005.A0722

Constant-step stress accelerated life test of Vacuum Fluorescent Display （VFD） was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method （LSM） for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.