Properties of Ru-Doped Ca-Pr Manganate Thin Films Fabricated by PLD Technique
The Ca 0.85 Pr 0.15 Mn 1-y Ru y O 3 (y = 0, 0.04, 0.08, 0.12, 0.16, and 0.20) manganate thin films were prepared by pulsed laser deposition (PLD) technique. The X-ray diffraction (XRD) analysis revealed that the samples were single-phased with orthorhombic structure. The scanning electron microscopy...
Saved in:
Published in | IEEE transactions on magnetics Vol. 47; no. 10; pp. 3913 - 3916 |
---|---|
Main Authors | , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
New York, NY
IEEE
01.10.2011
Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The Ca 0.85 Pr 0.15 Mn 1-y Ru y O 3 (y = 0, 0.04, 0.08, 0.12, 0.16, and 0.20) manganate thin films were prepared by pulsed laser deposition (PLD) technique. The X-ray diffraction (XRD) analysis revealed that the samples were single-phased with orthorhombic structure. The scanning electron microscopy (SEM) images indicated that the samples were composed of homogeneous grains. The Hall-effect measurements showed that the carrier density and Hall mobility of films increased with increasing Ru-doped content. The magnetic field dependence of magnetization at various temperatures were measured by using the superconducting quantum interference device (SQUID) and showed that the increase of Ru-doping content induced the large Δ S change in broad range of temperature. This demonstrates a possible application of these materials in cooling devices as the relative cooling power (RCP) is proportial to -(Δ S ) max Δ TFWHM (where Δ TFWHM is the full width at half-maximum of Δ S ). |
---|---|
ISSN: | 0018-9464 1941-0069 |
DOI: | 10.1109/TMAG.2011.2154356 |