Properties of Ru-Doped Ca-Pr Manganate Thin Films Fabricated by PLD Technique

The Ca 0.85 Pr 0.15 Mn 1-y Ru y O 3 (y = 0, 0.04, 0.08, 0.12, 0.16, and 0.20) manganate thin films were prepared by pulsed laser deposition (PLD) technique. The X-ray diffraction (XRD) analysis revealed that the samples were single-phased with orthorhombic structure. The scanning electron microscopy...

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Bibliographic Details
Published inIEEE transactions on magnetics Vol. 47; no. 10; pp. 3913 - 3916
Main Authors Phung, Quoc Thanh, Yu, Seong-Cho, Nguyen, Duc Tho, Hoang, Nam Nhat
Format Journal Article Conference Proceeding
LanguageEnglish
Published New York, NY IEEE 01.10.2011
Institute of Electrical and Electronics Engineers
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Summary:The Ca 0.85 Pr 0.15 Mn 1-y Ru y O 3 (y = 0, 0.04, 0.08, 0.12, 0.16, and 0.20) manganate thin films were prepared by pulsed laser deposition (PLD) technique. The X-ray diffraction (XRD) analysis revealed that the samples were single-phased with orthorhombic structure. The scanning electron microscopy (SEM) images indicated that the samples were composed of homogeneous grains. The Hall-effect measurements showed that the carrier density and Hall mobility of films increased with increasing Ru-doped content. The magnetic field dependence of magnetization at various temperatures were measured by using the superconducting quantum interference device (SQUID) and showed that the increase of Ru-doping content induced the large Δ S change in broad range of temperature. This demonstrates a possible application of these materials in cooling devices as the relative cooling power (RCP) is proportial to -(Δ S ) max Δ TFWHM (where Δ TFWHM is the full width at half-maximum of Δ S ).
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2011.2154356