Double N Stubs for Impedance Matching Improvement of Pogo Pin Test Board at mmWave Applications

Function testing of radio frequency integrated circuits (RFICs) is a vital step to confirm the reliability of RFICs during mass production. However, impedance mismatching occurs because of discontinuous routing inside test boards, which are an important device in RFIC testing. Double N stubs (DNS) a...

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Bibliographic Details
Published inIEEE transactions on components, packaging, and manufacturing technology (2011) Vol. 13; no. 7; pp. 1070 - 1073
Main Authors Kung, Ming-Lung, Tung, Ya-Ting, Lin, Ken-Huang, Lu, Chun-Lang, Yao, Chun-Han, Luo, Yuan-Wen
Format Journal Article
LanguageEnglish
Published Piscataway IEEE 01.07.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Boards
Circuit boards
Circuit design
Circuit reliability
Impedance
Impedance matching
Integrated circuit interconnections
Integrated circuits
Mass production
Millimeter waves
mmWave
Pins
pogo pin
Printed circuits
Radiofrequency integrated circuits
Reflectance
Sockets
stub
Testing
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Summary:Function testing of radio frequency integrated circuits (RFICs) is a vital step to confirm the reliability of RFICs during mass production. However, impedance mismatching occurs because of discontinuous routing inside test boards, which are an important device in RFIC testing. Double N stubs (DNS) are proposed for replacing the conventional lumped components to improve the impedance matching of test boards. DNS can be analytically designed on the printed circuit board (PCB) trace of the load board. Experiments were conducted to validate this mechanism for effectively improving the reflection coefficient of test boards at mmWave bands such as 28 and 55 GHz.
ISSN:2156-3950
2156-3985
DOI:10.1109/TCPMT.2023.3292811