Study of 50 GeV proton ionization loss by semiconductor detector with smoothly tunable thickness

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 391; pp. 69 - 72
• Main Authors: Nazhmudinov, R.M., Kubankin, A.S., Shchagin, A.V., Shul'ga, N.F., Trofymenko, S.V., Britvich, G.I., Durum, A.A., Kostin, M. Yu, Maisheev, V.A., Chesnokov, Yu.A., Yanovich, A.A.
• Format: Journal Article
• Language: English
• Published: 15.01.2017