Study of 50 GeV proton ionization loss by semiconductor detector with smoothly tunable thickness

Saved in:
Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 391; pp. 69 - 72
Main Authors Nazhmudinov, R.M., Kubankin, A.S., Shchagin, A.V., Shul'ga, N.F., Trofymenko, S.V., Britvich, G.I., Durum, A.A., Kostin, M. Yu, Maisheev, V.A., Chesnokov, Yu.A., Yanovich, A.A.
Format Journal Article
LanguageEnglish
Published 15.01.2017
Online AccessGet full text

Cover

More Information
ISSN:0168-583X
DOI:10.1016/j.nimb.2016.11.004