Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector

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Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 1059; p. 168945
Main Authors Wu, Tianya, Li, Shuqi, Wang, Wei, Zhou, Jia, Yan, Ziyue, Hu, Yiming, Zhang, Xiaoxu, Liang, Zhijun, Wei, Wei, Zhang, Ying, Wei, Xiaomin, Huang, Xinhui, Zhang, Lei, Qi, Ming, Zeng, Hao, Jia, Xuewei, Hu, Jun, Fu, Jinyu, Zhang, Hongyu, Li, Gang, Wu, Linghui, Dong, Mingyi, Li, Xiaoting, Casanova, Raimon, Zhang, Liang, Dong, Jianing, Wang, Jia, Zheng, Ran, Lu, Weiguo, Grinstein, Sebastian, da Costa, João Guimarães
Format Journal Article
LanguageEnglish
Published 01.02.2024
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ISSN:0168-9002
DOI:10.1016/j.nima.2023.168945