Loss measurement and analysis of high-silica reflection bending optical waveguides

• Published in: Journal of lightwave technology Vol. 6; no. 1; pp. 41 - 46
• Main Authors: Himeno, A., Terui, H., Kobayashi, M.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.01.1988; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Circuit properties; Electric, optical and optoelectronic circuits; Electronics; Etching; Exact sciences and technology; Integrated optics. Optical fibers and wave guides; Loss measurement; Optical and optoelectronic circuits; Optical devices; Optical films; Optical losses; Optical reflection; Optical waveguide components; Optical waveguide theory; Optical waveguides; Semiconductor waveguides; Measurement; Single mode waveguide; Rib waveguide; Bending loss; Optical waveguide; Bent waveguide; Transmission loss; Light reflection; Calculating method

Bending loss of high-silica single-mode bending optical waveguides using a waveguide side-wall as a reflecting facet is described theoretically and experimentally as a function of the bending angle. Two types of bending waveguides, which have the reflecting facet exposed to the air coated with a met...