Loss measurement and analysis of high-silica reflection bending optical waveguides

Bending loss of high-silica single-mode bending optical waveguides using a waveguide side-wall as a reflecting facet is described theoretically and experimentally as a function of the bending angle. Two types of bending waveguides, which have the reflecting facet exposed to the air coated with a met...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 6; no. 1; pp. 41 - 46
Main Authors Himeno, A., Terui, H., Kobayashi, M.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.01.1988
Institute of Electrical and Electronics Engineers
Subjects
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Etching
Exact sciences and technology
Integrated optics. Optical fibers and wave guides
Loss measurement
Optical and optoelectronic circuits
Optical devices
Optical films
Optical losses
Optical reflection
Optical waveguide components
Optical waveguide theory
Optical waveguides
Semiconductor waveguides
Measurement
Single mode waveguide
Rib waveguide
Bending loss
Optical waveguide
Bent waveguide
Transmission loss
Light reflection
Calculating method
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Summary:Bending loss of high-silica single-mode bending optical waveguides using a waveguide side-wall as a reflecting facet is described theoretically and experimentally as a function of the bending angle. Two types of bending waveguides, which have the reflecting facet exposed to the air coated with a metal film, are treated. The causes of bending loss are discussed in terms of los due to the Goos-Hanchen effect and the perpendicularity and roughness of the reflecting facet.< >
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0733-8724
1558-2213
DOI:10.1109/50.3961