Development of the Line Protection Measurement and Control Device based on Domestic MCU

Abstract In this paper, the dual MCU hardware architecture of protection measurement and control device was presented by analyzing the current situation of domestic MCU and chip selection. The problems existing in ADC sampling accuracy and ADC integral non-linearity were studied. The design scheme o...

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Published inJournal of physics. Conference series Vol. 2108; no. 1; pp. 12017 - 12025
Main Authors Zhao, Chengxuan, Wang, Yuantao, Ni, Chuankun, Chen, Hu, Xu, Yunlong, Ma, Wei, Su, Yaxin
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.11.2021
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Summary:Abstract In this paper, the dual MCU hardware architecture of protection measurement and control device was presented by analyzing the current situation of domestic MCU and chip selection. The problems existing in ADC sampling accuracy and ADC integral non-linearity were studied. The design scheme of high-precision ADC acquisition system based on dual MCU architecture was proposed, which could meet the requirements of technical specifications by using oversampling and adaptive processing of sampling nonlinear area. In terms of reliability, the EMC performance of the device was promoted by the improvement of outlet and ADC acquisition circuit.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2108/1/012017