Accuracy of Difference Schemes in Electromagnetic Applications: A Trefftz Analysis

The article examines local approximation errors of finite-difference schemes in electromagnetic analysis. Despite a long history of the subject, several accuracy-related issues have been overlooked and/or remain controversial. For example, conflicting claims have been made in the literature about th...

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Bibliographic Details
Published inIEEE transactions on magnetics Vol. 57; no. 6; pp. 1 - 4
Main Author Tsukerman, Igor
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:The article examines local approximation errors of finite-difference schemes in electromagnetic analysis. Despite a long history of the subject, several accuracy-related issues have been overlooked and/or remain controversial. For example, conflicting claims have been made in the literature about the order of Yee-like schemes in the vicinity of slanted or curved material interfaces. Two novel practical methods for comparison of local accuracy of difference schemes are proposed: one makes use of Trefftz test matrices , and the other one relies on a new measure of approximation accuracy in scheme-exact Trefftz subspaces . One particular conclusion is that a loss of accuracy for Yee-like schemes at slanted material boundaries is unavoidable.
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ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2021.3068346