Accuracy of Difference Schemes in Electromagnetic Applications: A Trefftz Analysis
The article examines local approximation errors of finite-difference schemes in electromagnetic analysis. Despite a long history of the subject, several accuracy-related issues have been overlooked and/or remain controversial. For example, conflicting claims have been made in the literature about th...
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Published in | IEEE transactions on magnetics Vol. 57; no. 6; pp. 1 - 4 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.06.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | The article examines local approximation errors of finite-difference schemes in electromagnetic analysis. Despite a long history of the subject, several accuracy-related issues have been overlooked and/or remain controversial. For example, conflicting claims have been made in the literature about the order of Yee-like schemes in the vicinity of slanted or curved material interfaces. Two novel practical methods for comparison of local accuracy of difference schemes are proposed: one makes use of Trefftz test matrices , and the other one relies on a new measure of approximation accuracy in scheme-exact Trefftz subspaces . One particular conclusion is that a loss of accuracy for Yee-like schemes at slanted material boundaries is unavoidable. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ISSN: | 0018-9464 1941-0069 |
DOI: | 10.1109/TMAG.2021.3068346 |