Characterizing S-Parameters of Microwave Coaxial Devices with up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications

Multi-port microwave devices operating at cryogenic temperatures are used in quantum computing to enable complex quantum operations. These components need to be precisely characterized at their operating temperature to ensure adequate overall system performance. In this work, an S-parameter measurem...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 73; p. 1
Main Authors Stanley, Manoj, Salter, Martin, Urbonas, Jonas, Skinner, James, Shin, Sang-hee, De Graaf, Sebastian E., Ridler, Nick M.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2024
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Calibration
cryogenic measurements
Cryogenic temperature
Cryogenics
Devices
Dilution
microwave calibration
Microwave circuits
Microwave devices
Microwave measurement
multi-port devices
Operating temperature
Parameters
Performance evaluation
Quantum computing
S-parameters
vector network analyzer
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Summary:Multi-port microwave devices operating at cryogenic temperatures are used in quantum computing to enable complex quantum operations. These components need to be precisely characterized at their operating temperature to ensure adequate overall system performance. In this work, an S-parameter measurement system to characterize the performance of coaxial connectorized microwave devices having up to four ports at temperatures of 3 K and above is presented. A four-port calibration setup is implemented at the 3 K temperature stage inside a dilution refrigerator. Measurement results for devices under test at 3 K are presented and the performance of the measurement system is evaluated.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2024.3369144