Deep Imbalanced Separation Network: A Holistic Fault Detection Framework Considering Class-Imbalance and Partial Label-Unknown

The challenges of class-imbalance and partially unknown training labels often arise in fault detection tasks. When these two problems occur simultaneously, existing imbalanced classification methods cannot be directly used due to the absence of the label, and the class-imbalance would lead to severe...

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Bibliographic Details
Published inIEEE transactions on industrial informatics Vol. 20; no. 11; pp. 13026 - 13035
Main Authors Qian, Min, Li, Yan-Fu, Wu, Hui
Format Journal Article
LanguageEnglish
Published Piscataway IEEE 01.11.2024
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:The challenges of class-imbalance and partially unknown training labels often arise in fault detection tasks. When these two problems occur simultaneously, existing imbalanced classification methods cannot be directly used due to the absence of the label, and the class-imbalance would lead to severe bias prediction. In this study, we proposed a novel deep imbalance separation network (deepImSN) framework that is capable of dealing with fault detection problems with both class imbalance and partially unknown labels. This framework integrates the one-class learning concept into the positive-unlabeled (PU) learning theory for the first time. It alleviates the bias of the class-imbalance while making full use of the limited label information in the PU set to optimize the feature space and guide model training. The proposed deepImSN is designed to be used in different scenarios. It can accurately complete the fault detection task whether only part of fault samples or normal samples are labeled, and the class-prior is known or unknown. Experimental results on real-world problems, such as high-speed rail wheels fault inspection and wafer map fault detection, demonstrate that deepImSN outperforms existing methods in various experimental conditions.
Bibliography:ObjectType-Article-1
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content type line 14
ISSN:1551-3203
1941-0050
DOI:10.1109/TII.2024.3431048