Measurement of magnetic parameters of nanometer-thick conducting magnetic films using anisotropic magnetoresistive effect

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Bibliographic Details
Published in	Technical physics Vol. 51; no. 11; pp. 1468 - 1473
Main Authors	Medved, A. V., Kryshtal, R. G., Krikunov, A. I.
Format	Journal Article
Language	English
Published	01.11.2006
Online Access	Get full text

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ISSN:	1063-7842 1090-6525
DOI:	10.1134/S1063784206110120