Modification of tube-based X-ray fluorescence spectrometer with an Am-241 excitation-based attachment for rare-earth elements analysis
This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer’s...
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Published in | Cogent engineering Vol. 11; no. 1 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Taylor & Francis Group
31.12.2024
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Subjects | |
Online Access | Get full text |
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Summary: | This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer’s utility. Successful identification and quantification of Scandium (8.1 ± 1.3 mg\kg), Ytterium (7.9 ± 2.0 mg\kg), Lanthanum (27.5 ± 2.1 mg\kg), Cerium (60.4 ± 2.5 mg\kg), Neodymium (29.7 ± 1.2 mg\kg), Samarium (4.6 ± 2.0 mg\kg), Europium (0.8 ± 0.4 mg\kg), Gadolinium (2.6 ± 0.6 mg\kg), and Erbium (3.5 ± 1.2 mg\kg) were achieved using their K-X-rays. The quantitative analysis employed the "Elemental Sensitivities Method" and was validated against established methods like Instrumental Neutron Activation Analysis (INAA) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS). The modified system demonstrated an accuracy of approximately 80% in analyzing REEs in the IAEA-Soil 7 reference material. |
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ISSN: | 2331-1916 2331-1916 |
DOI: | 10.1080/23311916.2024.2356168 |