Modification of tube-based X-ray fluorescence spectrometer with an Am-241 excitation-based attachment for rare-earth elements analysis

This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer’s...

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Bibliographic Details
Published inCogent engineering Vol. 11; no. 1
Main Authors Adeti, Prince James, Tandoh, Joseph B., Owiredu, Gyampo, Ahiamadjie, Hyacinthe, Annan, Ruth Araba Tawiah, Aniabo, Eli Jackson, Fianoo, Georgina Esinam, Akoto Bamford, Samuel, Amoako, George
Format Journal Article
LanguageEnglish
Published Taylor & Francis Group 31.12.2024
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Summary:This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer’s utility. Successful identification and quantification of Scandium (8.1 ± 1.3 mg\kg), Ytterium (7.9 ± 2.0 mg\kg), Lanthanum (27.5 ± 2.1 mg\kg), Cerium (60.4 ± 2.5 mg\kg), Neodymium (29.7 ± 1.2 mg\kg), Samarium (4.6 ± 2.0 mg\kg), Europium (0.8 ± 0.4 mg\kg), Gadolinium (2.6 ± 0.6 mg\kg), and Erbium (3.5 ± 1.2 mg\kg) were achieved using their K-X-rays. The quantitative analysis employed the "Elemental Sensitivities Method" and was validated against established methods like Instrumental Neutron Activation Analysis (INAA) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS). The modified system demonstrated an accuracy of approximately 80% in analyzing REEs in the IAEA-Soil 7 reference material.
ISSN:2331-1916
2331-1916
DOI:10.1080/23311916.2024.2356168