Depth Analysis of Crystalline Silicon Used for Radiation-Hard Detectors

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Bibliographic Details
Published inActa physica Polonica, A Vol. 132; no. 4; pp. 1387 - 1392
Main Authors Moloi, S.J., McPherson, M.
Format Journal Article
LanguageEnglish
Published 01.10.2017
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ISSN:0587-4246
1898-794X
DOI:10.12693/APhysPolA.132.1387