Rectilinear Planar Near-Field Measurements From the Perspective of the Synthetic Phased Array

A new far-field valid angle equation for rectilinear planar near-field measurements is derived. The new valid angle equation is derived by viewing the near-field to far-field transformation process as the generation of a pseudo plane wave by a synthetic phased array and subjecting the antenna-under-...

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Bibliographic Details
Published inIEEE transactions on antennas and propagation Vol. 70; no. 10; pp. 9806 - 9818
Main Authors Cutshall, Ryan T., Dobbins, Justin A., Freking, Jacob A., Hertneky, Brandon J.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.10.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:A new far-field valid angle equation for rectilinear planar near-field measurements is derived. The new valid angle equation is derived by viewing the near-field to far-field transformation process as the generation of a pseudo plane wave by a synthetic phased array and subjecting the antenna-under-test (AUT) to the radiation from this synthetic array. The synthetic phased array does not physically exist; rather, the array is formed during the postprocessing of the planar near-field measurements. The resultant valid far-field angle computed with the new equation is compared against previously established and popularly accepted valid angle equations. A brief discussion is offered on the measurement of low-directivity antennas with a planar near-field measurement system and on amplitude tapering of the near-field measurements to improve the quality of the pseudo plane wave inside the test zone.
ISSN:0018-926X
1558-2221
DOI:10.1109/TAP.2022.3191203