Effect of texturization on a-Si:H/c-Si hetero-junctions investigated by PCD and μ W-PCD mapping of minority carrier’s lifetime

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Bibliographic Details
Published in	Surface topography metrology and properties Vol. 7; no. 4; p. 45003
Main Authors	Ben Alaya, C, Dridi Rezgui, B, Aouida, S, Ronda, A, Abbarchi, M, Khirouni, K, Bouaïcha, M
Format	Journal Article
Language	English
Published	01.12.2019
Online Access	Get full text

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ISSN:	2051-672X 2051-672X
DOI:	10.1088/2051-672X/ab3efa