Statistical Procedures for Determining Electronic Part Design Margin Breakpoints

This note presents a set of statistical procedures for accepting or rejecting part types on the basis of lot sample tests-to failure or parameter degradation tests of parts subject to weapon-induced environments.

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 31; no. 6; pp. 1423 - 1426
Main Author Clement, David M.
Format Journal Article
LanguageEnglish
Published IEEE 01.01.1984
Subjects
Degradation
Delta modulation
Equations
Inverse problems
Log-normal distribution
Performance evaluation
Probability
Random variables
System testing
Weapons
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Summary:This note presents a set of statistical procedures for accepting or rejecting part types on the basis of lot sample tests-to failure or parameter degradation tests of parts subject to weapon-induced environments.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1984.4333523