A multipurpose probe sensor for scanning nanohardness testers

The construction of the multifunctional probe sensor, which combines the functions of a scanning probe microscope, a nanohardness tester, and a tribometer, is described and simulation results for different operating modes of this device are presented. An analytical model for the probe self-oscillati...

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Bibliographic Details
Published inInstruments and experimental techniques (New York) Vol. 56; no. 5; pp. 576 - 583
Main Authors Gogolinskii, K. V., Maslenikov, I. I., Reshetov, V. N., Useinov, A. S.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.09.2013
Subjects
Electrical Engineering
Laboratory Techniques
Measurement Science and Instrumentation
Physical Chemistry
Physics
Physics and Astronomy
Piezoelectric Plate
Hertz Model
Tuning Fork
Frequency Shift
Contact Stiffness
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Summary:The construction of the multifunctional probe sensor, which combines the functions of a scanning probe microscope, a nanohardness tester, and a tribometer, is described and simulation results for different operating modes of this device are presented. An analytical model for the probe self-oscillation mode within a self-oscillation scheme of excitation is proposed. The characteristics of the sensor under scanning conditions and during measurements in the force-spectroscopy mode are analyzed. Operability tests are conducted and the main characteristics of the probe are determined.
ISSN:0020-4412
1608-3180
DOI:10.1134/S0020441213050047