Analysis of nonexponential capacitance relaxation signals

The kinetics of charge transfer by deep energy levels of the semiconductor gap, describing nonexponential shape of capacitance relaxation signals, is suggested. A method of analysis of these signals, possessing higher accuracy and resolution in comparison with the conventional methods based on the r...

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Bibliographic Details
Published inRussian physics journal Vol. 52; no. 7; pp. 733 - 741
Main Authors Tatokhin, E. A., Budanov, A. V., Rudnev, E. V., Kadantsev, A. V., Semenov, M. E.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.07.2009
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Summary:The kinetics of charge transfer by deep energy levels of the semiconductor gap, describing nonexponential shape of capacitance relaxation signals, is suggested. A method of analysis of these signals, possessing higher accuracy and resolution in comparison with the conventional methods based on the relaxation-time approximation, is developed.
ISSN:1064-8887
1573-9228
DOI:10.1007/s11182-009-9292-6