APA (7th ed.) Citation

Zielinski, M., Cela, E., Radisson, D., Chapelle, A., Schwarzenbach, W., Guiot, E., . . . Biard, H. (2024). Application of Advanced Characterization Techniques to SmartSiC™ Product for Substrate-Level Device Performance Optimization. Materials science forum, 1124, 27-34. https://doi.org/10.4028/p-Bf6cd7

Chicago Style (17th ed.) Citation

Zielinski, Marcin, Enrica Cela, Damien Radisson, Audrey Chapelle, Walter Schwarzenbach, Eric Guiot, Roland B. Simon, Alexis Drouin, and Hugo Biard. "Application of Advanced Characterization Techniques to SmartSiC™ Product for Substrate-Level Device Performance Optimization." Materials Science Forum 1124 (2024): 27-34. https://doi.org/10.4028/p-Bf6cd7.

MLA (9th ed.) Citation

Zielinski, Marcin, et al. "Application of Advanced Characterization Techniques to SmartSiC™ Product for Substrate-Level Device Performance Optimization." Materials Science Forum, vol. 1124, 2024, pp. 27-34, https://doi.org/10.4028/p-Bf6cd7.