Crystal structure, ion transport and optical properties of new high-conductivity Ag7(Si1 − xGex)S5I solid solutions

The crystal structure of Ag 7 (Si 0.8 Ge 0.2 )S 5 I, Ag 7 (Si 0.6 Ge 0.4 )S 5 I, Ag 7 (Si 0.4 Ge 0.6 )S 5 I and Ag 7 (Si 0.2 Ge 0.8 )S 5 I solid electrolytes, grown by vertical zone crystallization method (solution–melt technique), was studied using X-ray diffraction analysis by the Rietveld refinem...

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Bibliographic Details
Published inJournal of materials science Vol. 57; no. 12; pp. 6706 - 6722
Main Authors Pogodin, A. I., Studenyak, I. P., Shender, I. A., Pop, M. M., Filep, M. J., Malakhovska, T. O., Kokhan, O. P., Kopčanský, P., Babuka, T. Y.
Format Journal Article
LanguageEnglish
Published New York Springer US 01.03.2022
Springer Nature B.V
Subjects
Characterization and Evaluation of Materials
Chemistry and Materials Science
Classical Mechanics
Crystal structure
Crystallization
Crystallography and Scattering Methods
Electrical resistivity
Electrolytes
Ellipsometry
Energy Materials
Frequency ranges
Ion transport
Ions
Materials Science
Molten salt electrolytes
Optical properties
Polymer Sciences
Refractivity
Rietveld method
Room temperature
Solid electrolytes
Solid Mechanics
Solid solutions
Spectrometry
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Summary:The crystal structure of Ag 7 (Si 0.8 Ge 0.2 )S 5 I, Ag 7 (Si 0.6 Ge 0.4 )S 5 I, Ag 7 (Si 0.4 Ge 0.6 )S 5 I and Ag 7 (Si 0.2 Ge 0.8 )S 5 I solid electrolytes, grown by vertical zone crystallization method (solution–melt technique), was studied using X-ray diffraction analysis by the Rietveld refinement method. The electrical conductivity of Ag 7 (Si 1 −  x Ge x )S 5 I solid solutions were measured by impedance spectroscopy technique in frequency range from 10 Hz to 2 × 10 6  Hz and temperature interval from 293 to 383 K. The compositional dependences of ionic part of total electrical conductivity and its activation energy were analyzed. The main features of the ion transport mechanism in Ag 7 (Si 1 −  x Ge x )S 5 I solid solutions caused by Si 4+  ↔ Ge 4+ cationic substitution are explained via simple structural descriptors (SOF, d max , ECoN). The spectral dependences of refractive index for Ag 7 (Si 1 −  x Ge x )S 5 I solid electrolytes were measured by the spectral ellipsometry technique. The spectrometric measurements of optical absorption edge in Ag 7 (Si 1 −  x Ge x )S 5 I solid solutions were carried out at room temperature. The compositional variation of energy pseudogap, Urbach energy and refractive indices in Ag 7 (Si 1 −  x Ge x )S 5 I solid solutions were studied. Graphical abstract
ISSN:0022-2461
1573-4803
DOI:10.1007/s10853-022-07059-1