Reliability study of InAs∕InGaAs quantum dot diode lasers

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Bibliographic Details
Published inElectronics letters Vol. 41; no. 24; p. 1330
Main Authors Krestnikov, I., Livshits, D., Mikhrin, S., Kozhukhov, A., Kovsh, A., Ledentsov, N., Zhukov, A.
Format Journal Article
LanguageEnglish
Published 24.11.2005
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ISSN:0013-5194
DOI:10.1049/el:20053336