A simple method for the direct measurement of diffraction patterns in the EM400 T transmission electron microscope

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Bibliographic Details
Published inJournal of physics. E, Scientific instruments Vol. 16; no. 6; pp. 483 - 486
Main Author Tambuyser, P
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.06.1983
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ISSN:0022-3735
DOI:10.1088/0022-3735/16/6/010