Mapping Magnetic Ordering With Aberrated Electron Probes in STEM

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 22; no. S3; pp. 1676 - 1677
Main Authors Idrobo, Juan Carlos, Ján Rusz, Spiegelberg, Jakob, McGuire, Michael A., Symons, Christopher T., Vatsavai, Ranga Raju, Cantoni, Claudia, Lupini, Andrew R.
Format Journal Article Conference Proceeding
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2016
Oxford University Press
Subjects
aberration
EELS
EMCD
Magnetic Materials, Phenomena and Imaging at the Nanoscale
Physical Science Symposia
STEM
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More Information
Bibliography:USDOE Office of Science (SC)
AC05-00OR22725
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616009223