TEM and FESEM: The Right Combination for Enhanced Particle Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 14; no. S2; pp. 580 - 581
Main Authors	Bunker, KL, McAllister, D, Allison, KA, Wagner, K, Rickabaugh, K, Levine, AM, Strohmeier, BR, Lee, RJ
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2008 Oxford University Press
Subjects	Metallographic Techniques and Material Characterization
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927608083682