Nanostructure characterization of (SmS)1.19TaS2 by means of STM/STS

• Published in: Journal of crystal growth Vol. 297; no. 1; pp. 7 - 9
• Main Authors: WINIARZ, S, KLIMCZUK, T, CAVA, R. J, CZAJKA, R
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier 15.12.2006
• Subjects: Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Inorganic compounds; Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Physics; Structure of solids and liquids; crystallography; Structure of specific crystalline solids; Vapor phase epitaxy; growth from vapor phase; Samarium sulfides; Inorganic compounds; Symmetry property; Lattice distortion; Al. Crystal structure; Al. Surface structure; Bl. Rare-earth compounds; Transition element compounds; Thick films; Crystal growth from vapors; Nanostructures; Rare earth compounds; Experimental study; Surface structure; 68.35.Bs; 68.37.-d; 68.37.Ef; Scanning tunneling microscopy; Lamellar structure; Chemical transport; Trigonal lattices; Cleavage; Tantalum sulfides; IV characteristic; Crystal structure
• ISSN: 0022-0248; 1873-5002
• DOI: 10.1016/j.jcrysgro.2006.09.030

Layered transition-metal dichalcogenide (LTMD) materials have been studied extensively. These materials can be easily intercalated with different elements due to their layered structure. This report shows the results of scanning tunneling microscopy and spectroscopy (STM/S) investigations of (SmS1.19TaS2 misfit-layer compound. This compound is composed of two trigonal triple layers of S-Ta-S separated from one another by the SmS double layer. The structure of SmS layers exhibits square symmetry contrary to the trigonal TaS2 host structure. The observed lattice symmetry suggests that the SmS layer was exposed due to cleavage process made before measurements. The I-V characteristics measured above the sample surface showed metallic-like behavior of this material.