Activation energy of electromigration in thin metal films

Saved in:
Bibliographic Details
Published inChinese physics letters Vol. 3; no. 2; pp. 65 - 68
Main Authors Qimin, Wang, Yunzhong, Wu, Chenglong, Sun
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.02.1986
Online AccessGet full text

Cover

More Information
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/3/2/005