SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 10; no. S02; pp. 950 - 951
Main Authors	Takeuchi, Shuichi, Muto, Atsushi, Nakagawa, Mine, White, Sara, Tamochi, Ryuichiro, Sato, Mitsugu, Yamada, Mitsuhiko, Joy, David C
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2004 Oxford University Press
Subjects	Accessorizing the SEM
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927604880711