X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface

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Bibliographic Details
Published inTechnical physics letters Vol. 31; no. 6; pp. 491 - 493
Main Authors Okunev, A. O., Shul’pina, I. L.
Format Journal Article
LanguageEnglish
Published 01.01.2005
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ISSN:1063-7850
1090-6533
DOI:10.1134/1.1969776