Scanning X-ray Microscopy Based on Kumakhov Optics and a Raster X-ray Source

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Bibliographic Details
Published inTechnical physics letters Vol. 31; no. 3; p. 202
Main Author Gelever, V. D.
Format Journal Article
LanguageEnglish
Published 2005
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ISSN:1063-7850
DOI:10.1134/1.1894432