A SSR Marker for Leaf Rust Resistance Gene Lr19 in Wheat

• Published in: Agricultural sciences in China Vol. 5; no. 2; pp. 111 - 115
• Main Authors: LI, Xing, YANG, Wen-xiang, LI, Ya-ning, LIU, Da-qun, YAN, Hong-fei, MENG, Qing-fang, ZHANG, Ting
• Format: Journal Article
• Language: English
• Published: Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University/Biological Control Center of Plant Diseases and Plant Pests of Hebei Province, Baoding 071001, P.R. China 01.02.2006
• Subjects: SSR; 分子标记; microsatellite; wheat leaf rust; Lrl9
• ISSN: 1671-2927
• DOI: 10.1016/S1671-2927(06)60027-8

Microsatellite was carded out in Thatcher, six near-isogenic lines and F2 progeny of TcLr19xThatcher to develop molecular markers for leaf rust resistance gene Lr19. Thirteen primer pairs were screened, of which one primer pair Xgwm44 displayed polymorphsim in the population of TcLr 19, Thatcher, and their F2 generations. One marker closed linked to Lr19 resistance trait was obtained, and was named Xgwm44139bp with the genetic distance 0.9 cM. The research shows that Lr19 has more potential in marker-assisted breeding programs in wheat and provides a step stone for mapping genetic map, physical map and the eventual cloning.