Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application

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Bibliographic Details
Published inJournal of semiconductor technology and science Vol. 22; no. 5; pp. 376 - 385
Main Authors Jeong, Tae-Woong, Oh, Yun-Jae, Chun, Seo-Yeon, Kim, Dae Hwan, Lee, Woojoo, Cho, Il-Hwan
Format Journal Article
LanguageEnglish
Published 대한전자공학회 01.10.2022
Subjects
Field effect transistor
CMOS logic
high temperature operation
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ISSN:1598-1657
2233-4866
DOI:10.5573/JSTS.2022.22.5.376