闫锋, 马. 纪. 陈. 夏. 朱. 郭. (2014). Extraction of Channel Length Independent Series Resistance for Deeply Scaled Metal-Oxide-Semiconductor Field-Effect Transistors. Chinese physics letters, 31(9), 141-143. https://doi.org/10.1088/0256-307X/31/9/097302
Chicago Style (17th ed.) Citation闫锋, 马丽娟 纪小丽 陈原聪 夏好广 朱晨昕 郭强. "Extraction of Channel Length Independent Series Resistance for Deeply Scaled Metal-Oxide-Semiconductor Field-Effect Transistors." Chinese Physics Letters 31, no. 9 (2014): 141-143. https://doi.org/10.1088/0256-307X/31/9/097302.
MLA (9th ed.) Citation闫锋, 马丽娟 纪小丽 陈原聪 夏好广 朱晨昕 郭强. "Extraction of Channel Length Independent Series Resistance for Deeply Scaled Metal-Oxide-Semiconductor Field-Effect Transistors." Chinese Physics Letters, vol. 31, no. 9, 2014, pp. 141-143, https://doi.org/10.1088/0256-307X/31/9/097302.