Improved sensitivity for low abundance ions in glow discharge Fourier transform ion cyclotron resonance mass spectrometry following ion preselection in an external octopole ion guide

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Bibliographic Details
Published inJournal of analytical atomic spectrometry Vol. 19; no. 12; p. 1513
Main Authors Zientek, Keith D., Eyler, John R.
Format Journal Article
LanguageEnglish
Published 01.01.2004
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ISSN:0267-9477
1364-5544
DOI:10.1039/b403218g