Shrink Generator-based Strong PUF Architecture with Improved Uniqueness and Reliability on an FPGA

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Bibliographic Details
Published inJournal of semiconductor technology and science Vol. 23; no. 1; pp. 26 - 38
Main Authors Kanda, Guard, Ryoo, Kwangki
Format Journal Article
LanguageEnglish
Published 대한전자공학회 01.02.2023
Subjects
PUF
strong PUF
shrink generator
challenge-response-pair (CRP)
configurable ring oscillator (CRO) PUF
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ISSN:1598-1657
2233-4866
DOI:10.5573/JSTS.2023.23.1.26