Time evolution of the microstructures of LaAlO3 thin films grown on Si substrates

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Bibliographic Details
Published inApplied physics. A, Materials science & processing Vol. 84; no. 3; pp. 341 - 344
Main Authors LI, X. L, XIANG, W. F, JING, H. Y, LU, H. B, MAI, Z. H
Format Journal Article
LanguageEnglish
Published Berlin Springer 01.08.2006
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure and morphology; thickness
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Thin films
Interfaces
Lanthanum oxides
Annealing
Structure stability
X-ray reflection
Amorphous state
Diffusion
Microstructure
Aluminium oxides
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ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-006-3616-y