Rutherford backscattering spectrometry, particle induced X-ray emission and atomic force microscopy of InAs thin films grown on GaAs : a complementary study
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Published in | Thin solid films Vol. 278; no. 1-2; pp. 155 - 166 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Lausanne
Elsevier Science
15.05.1996
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Subjects | |
Online Access | Get full text |
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ISSN: | 0040-6090 1879-2731 |
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DOI: | 10.1016/0040-6090(95)08175-5 |