Atomic and Electronic Reconstruction at the a-LAO/STO Interface by E-Beam Induced Crystallization

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 25; no. S2; pp. 1894 - 1895
Main Authors	Lee, Gwangyeob, Kim, Shin-ik, Han, Gyeongtak, Kim, Young-Min, Baek, Seung-Hyub, Kim, Do Hyang, Chang, Hye Jung
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2019 Oxford University Press
Subjects	Crystallization Electron beams In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies Physical Science Symposia
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ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927619010201