Studying Trapped Grains in Alumina using SEM and EBSD

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 12; no. S02; pp. 1020 - 1021
Main Authors Riesterer, JL, Farrer, JK, Ravishankar, N, Carter, CB
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2006
Oxford University Press
Subjects
Alumina
Grain boundaries
Grain growth
Materials science
Multi-length Scale Characterization of Materials from Nanometer to Millimeter
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927606063069