Low Energy X-Ray Detection with a Silicon Multi-Cathode Detector for Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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Published inMicroscopy and microanalysis Vol. 12; no. S02; pp. 864 - 865
Main Authors Barkan, S, Saveliev, V, Tull, C, Feng, L, Takahashi, M, Matsumori, N, Newbury, D, Small, J, Iwanczyk, J
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2006
Oxford University Press
Subjects
Boron
Electron microscopes
Energy
Microscopy
Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos
Sensors
Silicon nitride
X-rays
United States > US
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927606062027